Publication:
First–principles parameter–free modeling of n– and p–FET hot–carrier degradation
Date
Loading...
Journal
Abstract
Description
Metrics
Views
2002 since deposited on 2021-10-27
1last month
Acq. date: 2025-12-10
Citations
Metrics
Views
2002 since deposited on 2021-10-27
1last month
Acq. date: 2025-12-10
Citations