Publication:

First–principles parameter–free modeling of n– and p–FET hot–carrier degradation

Date

2019

Proceedings Paper

Simple item page Full metadata Statistics

Author(s)

;

Tyaginov, Stanislav

;

;

;

;

Jungemann, Christoph

;

;

Statistics

2003 since deposited on 2021-10-27

Acq. date: 2026-02-26