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Browsing by Author "Jacobs, B."

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    Chemical role of SF6 in a SiCl4-based reactive ion etching of GaN

    Karouta, F.
    ;
    Jacobs, B.
    ;
    Kramer, M. C. J. C. M.
    ;
    Jacobs, Koen
    ;
    Moerman, Ingrid  
    Oral presentation
    1999, Semiconductor and Integrated Optoelectronics - SIOE
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    Highly chemical reactive ion etching of gallium nitride

    Karouta, F.
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    Jacobs, B.
    ;
    Moerman, Ingrid  
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    Jacobs, Koen
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    Weyher, J. L.
    ;
    Nowak, G.
    ;
    Crane, R.
    Journal article
    2000, MRS Internet Journal of Nitride Semiconductor Research, 5S1, p.W11.76
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    Highly chemical reactive ion etching of gallium nitride

    Karouta, F.
    ;
    Jacobs, B.
    ;
    Moerman, I.
    ;
    Jacobs, K.
    ;
    Weyher, J.L.
    ;
    Porowski, S.
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    Crane, R.
    ;
    Hageman, P.R.
    Proceedings paper
    2000, GaN and Related Alloys, 28/11/1999, p.W11.76
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    Ideal chemistry for reactive ion etching of GaN

    Karouta, F.
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    Jacobs, B.
    ;
    Jacobs, Koen
    ;
    Moerman, Ingrid  
    Oral presentation
    1999, LEOS Workshop; Amsterdam.
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    Ideal chemistry for reactive ion etching of GaN

    Karouta, F.
    ;
    Jacobs, B.
    ;
    Jacobs, Koen
    ;
    Moerman, Ingrid  
    Oral presentation
    1999, 1st Workshop on GaN Electronic Devices
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    Implementation approaches for spare capacity in meshed WDM transport networks

    Van Caenegem, Bart
    ;
    Jacobs, B.
    ;
    Demeester, Piet  
    Proceedings paper
    1997, Proceedings of the Annual Symposium of the IEEE/LEOS Benelux Chapter; November 26, 1997. Eindhoven, The Netherlands., p.97-100
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    Investigation on p-contacts in Mg-doped GaN and the effect of various pre-treatments

    Karouta, F.
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    Ruscassié, R
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    Kramer, M.C.J.C.M.
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    Jacobs, B.
    ;
    Jacobs, Koen
    ;
    Moerman, Ingrid  
    Proceedings paper
    2001, Proceedings Symposium 6th IEEE/LEOS Benelux Chapter, 3/12/2001, p.101-104
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    Side-wall morphology in reactive ion etching of GaN

    Karouta, F.
    ;
    Jacobs, B.
    ;
    Jacobs, Koen
    ;
    Moerman, Ingrid  
    Proceedings paper
    1999, Proceedings of the 4th Annual Symposium IEEE/LEOS Benelux Chapter, 15/11/1999, p.215-217

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