Browsing by Author "Jiao, Hailong"
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Publication A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability
Journal article2022, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, (69) 2, p.554-558Publication Embedded toggle generator to control the switching activity
Proceedings paper2017-09, IEEE International Symposium on Power and Timing Modeling, Optimization, and Simulation - PATMOS, 25/09/2017, p.1-8Publication Embedded toggle generator to provide realistic test conditions during test of digital 2D-SoCs and 3D-SICs
Proceedings paper2018-05, CDN Live EMEA 2018, 7/05/2018Publication IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers
Proceedings paper2018-05, IEEE European Test Symposium - ETS, 28/05/2018Publication IEEE Std P1838: DfT standard-under-development for 2.5D-, 3D-, and 5.5D-SICs
Proceedings paper2016-05, 21th IEEE European Test Symposium - ETS, 24/05/2016, p.1-10Publication On-chip toggle generators to provide realistic conditions during test of digital 2D-SoCs and 3D-SICs
Proceedings paper2018-11, IEEE International Test Conference - ITC'18, 28/10/2018, p.1-9Publication Receiver Design With an Adjustable Energy-Signal-Quality Tradeoff for IoT Networks
Journal article2022, IEEE INTERNET OF THINGS JOURNAL, (9) 22, p.23086-23096Publication Testing for internal defects in library cells
Proceedings paper2017-05, ICT.OPEN, 21/03/2017