Browsing by Author "Jing, Xu"

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Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks

Maldonado, D.
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Roldan, J. B.
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Roldan, A. M.
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Jimenez-Molinos, F.
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Hui, F.
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Jing, Xu
;
Wen, C.
;
Lanza, M.
Proceedings paper
2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020
Standards for the Characterization of Endurance in Resistive Switching Devices

Lanza, Mario
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Waser, Rainer
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Ielmini, Daniele
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Yang, J. Joshua
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Goux, Ludovic
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Sune, Jordi
Journal article review
2021, ACS NANO, (15) 11, p.17214-17231