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Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks
Publication:
Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks
Date
2020
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Maldonado, D.
;
Roldan, J. B.
;
Roldan, A. M.
;
Jimenez-Molinos, F.
;
Hui, F.
;
Jing, Xu
;
Wen, C.
;
Lanza, M.
;
Shi, Yuanyuan
Journal
na
Abstract
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1774
since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations
Metrics
Views
1774
since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations