Publication:

Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks

Date

2020
Proceedings Paper
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Author(s)

Maldonado, D.
;
Roldan, J. B.
;
Roldan, A. M.
;
Jimenez-Molinos, F.
;
Hui, F.
;
Jing, Xu
;
Wen, C.
;
Lanza, M.
;
Shi, Yuanyuan  

Journal

na

Abstract

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1774 since deposited on 2021-11-02
Acq. date: 2026-01-25

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1774 since deposited on 2021-11-02
Acq. date: 2026-01-25

Citations