Browsing by Author "Jurczak, Malgorzata"
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Publication Capping-metal gate integration technology for multiple-VT CMOS in MuGFETs
Proceedings paper2008, IEEE International SOI Conference Proceedings, 6/10/2008, p.119-120Publication Identify the critical regions and switching/failure mechanisms in non-filamentary RRAM ( a-VMCO) by RTN and CVS techniques for memory window improvement
Proceedings paper2016, IEEE International Electron Devices Meeting - IEDM, 3/12/2016, p.564-567Publication Switching behavior of HfO2-based resistive RAM with vertical CNT bottom electrode
Proceedings paper2017, International Memory Workshop - IMW, 15/05/2017, p.1-4