Browsing by Author "Katcki, J."
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Publication Accurate extraction of the diffusion line current in silicon p-n junction diodes
Journal article1998, Applied Physics Letters, (72) 9, p.1054-1056Publication Electrical characterisation of shallow cobalt-silicided junctions
Proceedings paper2000, 3rd International Conference Materials for Microelectronics, 16/10/2000, p.7-10Publication Electrical characterization of shallow cobalt-silicided junctions
Journal article2001, Journal of Materials Science: Materials in Electronics, (12) 4_6, p.207-10Publication Extraction of accurate lifetime and doping profiles in Si p-n junction diodes
Meeting abstract1997, Belgische Natuurkundige Vereniging / Société Belge de Physique : General Scientific Meeting, 29/05/1997, p.CM35Publication Impact of fast neutron irradiation on the silicon p-n junction leakage and role of the diffusion reverse current
Oral presentation2001, Symposium B of the E-MRS Spring Meeting 2001: Defect Engineering of Advanced Semiconductor Devices; June 5-8, 2001; Strasbourg,Publication Impact of fast-neutron irradiation on the silicon P-N junction leakage and role of the diffusion reverse current
Journal article2002, Nuclear Instruments & Methods in Physics Research B, (186) 1_4, p.166-170Publication Optimised diode analysis of electrical silicon substrate properties
Proceedings paper1997, Crystalline Defects and Contamination Control: Their Impact and Control in Device Manufacturing II, 31/08/1997, p.218-227Publication Optimised diode assessment of the surface and bulk generation/recombination properties of silicon substrates
Proceedings paper1998, Semiconductor Silicon 1998. Proceedings of the 8th International Symposium on Silicon Materials Science and Technology, 4/05/1998, p.1576-1592Publication Optimized diode analysis of electrical silicon substrate properties
Journal article1998, Journal of the Electrochemical Society, (145) 6, p.2107-2112Publication p-n junction diagnostics to determine surface and bulk generation/recombination properties of silicon substrates
Journal article1999, J. Electrochem. Soc., (146) 3, p.1151-1157Publication Statistical analysis of shallow p-n junction leakage increase using XTEM results probabilities
Oral presentation2000, International Conference on Electronic Materials & European Materials Research Society Spring Meeting. Symposium M: Advanced ChaPublication Statistical analysis of shallow P-N junction leakage increase using XTEM results probabilities
Journal article2001, Materials Science in Semiconductor Processing, (4) 1_3, p.105-107