Browsing by Author "Keim, Martin"
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Publication IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair
Proceedings paper2024, 42nd VLSI Test Symposium (VTS), APR 22-24, 2024Publication New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405
Proceedings paper2024, IEEE European Test Symposium (ETS), MAY 20-24, 2024