Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405
Publication:
New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405
Date
2024
Proceedings Paper
https://doi.org/10.1109/ETS61313.2024.10567355
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Evans, Adrian
;
Chuang, Po-Yao
;
Keim, Martin
;
Chandra, Anshuman
Journal
N/A
Abstract
Description
Metrics
Views
57
since deposited on 2024-08-23
Acq. date: 2025-11-10
Citations
Metrics
Views
57
since deposited on 2024-08-23
Acq. date: 2025-11-10
Citations