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IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair
Publication:
IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair
Date
2024
Proceedings Paper
https://doi.org/10.1109/VTS60656.2024.10538776
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Pancholi, Vineet
;
Chuang, Po-Yao
;
Keim, Martin
Journal
N/A
Abstract
Description
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630
since deposited on 2024-08-09
5
last month
Acq. date: 2025-12-09
Citations
Metrics
Views
630
since deposited on 2024-08-09
5
last month
Acq. date: 2025-12-09
Citations