Publication:
IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | Pancholi, Vineet | |
| dc.contributor.author | Chuang, Po-Yao | |
| dc.contributor.author | Keim, Martin | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Chuang, Po-Yao | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.contributor.orcidimec | Chuang, Po-Yao::0000-0001-7325-8836 | |
| dc.date.accessioned | 2024-09-11T08:29:20Z | |
| dc.date.available | 2024-08-09T18:13:59Z | |
| dc.date.available | 2024-09-11T08:29:20Z | |
| dc.date.issued | 2024 | |
| dc.identifier.doi | 10.1109/VTS60656.2024.10538776 | |
| dc.identifier.eisbn | 979-8-3503-6378-4 | |
| dc.identifier.isbn | 979-8-3503-6379-1 | |
| dc.identifier.issn | 1093-0167 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44286 | |
| dc.publisher | IEEE | |
| dc.source.conference | 42nd VLSI Test Symposium (VTS) | |
| dc.source.conferencedate | APR 22-24, 2024 | |
| dc.source.conferencelocation | Tempe | |
| dc.source.journal | N/A | |
| dc.source.numberofpages | 11 | |
| dc.title | IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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