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Browsing by Author "Kemeling, Nathan"

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    Characterization and optimization of porogen based PECVD deposited extreme low-k materials as a function of UV-cure time

    Verdonck, Patrick  
    ;
    De Roest, David  
    ;
    Kaneko, Shinya
    ;
    Caluwaerts, Rudy  
    ;
    Tsuji, Naoto
    Journal article
    2007, Surface and Coatings Technology, (201) 22_23, p.9264-9268
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    Highly reliable Cu/ULK integratrion scheme using MHM and low-k capping film

    Tsutsue, Makoto
    ;
    Travaly, Youssef
    ;
    Ikeda, Atsushi
    ;
    Tokei, Zsolt  
    ;
    Willegems, Myriam  
    Oral presentation
    2007, Advanced Metallization Conference - AMC

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