Browsing by Author "Ker, Ming-Dou"
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Publication ESD Failures of GaN-on-Si D-Mode AlGaN/GaN MIS-HEMT and HEMT Devices for 5G Telecommunications
Proceedings paper2021, 43rd Annual EOS/ESD Symposium (EOS/ESD), SEP 26-OCT 01, 2021Publication ESD HBM Discharge Model in RF GaN-on-Si (MIS)HEMTs
Journal article2022-01-25, IEEE TRANSACTIONS ON ELECTRON DEVICES, (69) 4, p.2180-2187Publication Interconnect Capacitance Investigation and Optimization Under I/O Pad for ESD Protection of RF/High Speed Circuits in Micro- & Nano-scale CMOS Technology
Proceedings paper2020, 2020 International ESD Workshop (IEW), 4/05/2020Publication Latchup in bulk finFET technology
Proceedings paper2017, IEEE International Reliability Physics Symposium - IRPS, 1/04/2017, p.EL-1.1-EL-1.3Publication Local CDM ESD protection circuits for cross-power domains in 3D IC applications
; ; ;Scholz, Mirko ;Huang, Yu-Ching; Boschke, RomanJournal article2014-06, IEEE Transactions on Device and Materials Reliability, (14) 2, p.781-783Publication ON-State Human Body Model ESD Failure Mechanisms in GaN-on-Si RF MIS-HEMTs
Journal article2023, IEEE ELECTRON DEVICE LETTERS, (44) 8, p.1248-1251Publication RF/high-speed I/O ESD protection: Co-optimizing strategy between BEOL capacitance and HBM immunity in advanced CMOS process
Journal article2020, IEEE Transactions on Electron Devices, (67) 7, p.2752-2759