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Browsing by Author "Ker, Ming-Dou"

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    ESD Failures of GaN-on-Si D-Mode AlGaN/GaN MIS-HEMT and HEMT Devices for 5G Telecommunications

    Wu, Wei-Min  
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    Chen, Shih-Hung  
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    Putcha, Vamsi  
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    Peralagu, Uthayasankaran  
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    Sibaja-Hernandez, Arturo  
    Proceedings paper
    2021, 43rd Annual EOS/ESD Symposium (EOS/ESD), SEP 26-OCT 01, 2021
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    ESD HBM Discharge Model in RF GaN-on-Si (MIS)HEMTs

    Wu, Wei-Min  
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    Ker, Ming-Dou
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    Chen, Shih-Hung  
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    Sibaja-Hernandez, Arturo  
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    Yadav, Sachin  
    Journal article
    2022-01-25, IEEE TRANSACTIONS ON ELECTRON DEVICES, (69) 4, p.2180-2187
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    Interconnect Capacitance Investigation and Optimization Under I/O Pad for ESD Protection of RF/High Speed Circuits in Micro- & Nano-scale CMOS Technology

    Wu, Wei-Min  
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    Chen, Jie-Ting
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    Chen, Shih-Hung  
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    Ker, Ming-Dou
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    Linten, Dimitri  
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    Groeseneken, Guido  
    Proceedings paper
    2020, 2020 International ESD Workshop (IEW), 4/05/2020
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    Latchup in bulk finFET technology

    Dai, Chia Tsen
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    Chen, Shih-Hung  
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    Linten, Dimitri  
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    Scholz, Mirko
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    Hellings, Geert  
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    Boschke, Roman
    Proceedings paper
    2017, IEEE International Reliability Physics Symposium - IRPS, 1/04/2017, p.EL-1.1-EL-1.3
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    Local CDM ESD protection circuits for cross-power domains in 3D IC applications

    Chen, Shih-Hung  
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    Linten, Dimitri  
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    Scholz, Mirko
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    Huang, Yu-Ching
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    Hellings, Geert  
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    Boschke, Roman
    Journal article
    2014-06, IEEE Transactions on Device and Materials Reliability, (14) 2, p.781-783
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    ON-State Human Body Model ESD Failure Mechanisms in GaN-on-Si RF MIS-HEMTs

    Wu, Wei-Min  
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    Chen, Shih-Hung  
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    Shih, Chun-An
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    Parvais, Bertrand  
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    Collaert, Nadine  
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    Ker, Ming-Dou
    Journal article
    2023, IEEE ELECTRON DEVICE LETTERS, (44) 8, p.1248-1251
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    RF/high-speed I/O ESD protection: Co-optimizing strategy between BEOL capacitance and HBM immunity in advanced CMOS process

    Wu, Wei-Min  
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    Ker, Ming-Dou
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    Chen, Shih-Hung  
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    Chen, Jie-Ting
    ;
    Linten, Dimitri  
    ;
    Groeseneken, Guido  
    Journal article
    2020, IEEE Transactions on Electron Devices, (67) 7, p.2752-2759

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