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Browsing by Author "Kilchytska, V."

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    Effective mobility in FinFET structures with HfO2 and SiON gate dielectrics and TaN gate electrode

    Rudenko, Tamara
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    Collaert, Nadine  
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    De Gendt, Stefan  
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    Kilchytska, V.
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    Jurczak, Gosia  
    Journal article
    2005, Microelectronic Engineering, 80, p.386-389
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    FinFET analogue characterization from DC to 110 GHz

    Lederer, Dimitri  
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    Kilchytska, V.
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    Rudenko, T.
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    Collaert, Nadine  
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    Flandre, D.
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    Dixit, Abhisek
    Journal article
    2005, Solid-State Electronics, (49) 5, p.1488-1496
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    Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs

    Kilchytska, V.
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    Alvarado, J.
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    Collaert, Nadine  
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    Rooyackers, Rita
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    Put, Sofie
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    Simoen, Eddy  
    Journal article
    2011, Solid-State Electronics, (59) 1, p.18-24
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    High-energy neutrons effect on strained and non-strained SO MuGFETs and planar MOSFETs

    Kilchytska, V.
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    Alvarado, J.
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    Put, Sofie
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    Collaert, Nadine  
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    Simoen, Eddy  
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    Claeys, Cor
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    Militaru, O.
    Journal article
    2012, Microelectronics Reliability, (52) 1, p.118-123
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    In-depth investigation of 0.13 μm SOI MOSFETs for high-temperature applications

    Kilchytska, V.
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    De Meyer, Kristin  
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    Flandre, D.
    Proceedings paper
    2004, Proceedings Ultimate Integration of Silicon (ULIS) Workshop, 11/03/2004, p.163-166
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    Influence of device engineering on the analog and RF performances of SOI MOSFETs

    Kilchytska, V.
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    Nève, A.
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    Vancaillie, L.
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    Levacq, D.
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    Adriaensen, S.
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    van Meer, Hans
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    Raynaud, C.
    Journal article
    2003, IEEE Trans. Electron Devices, (50) 3, p.577-588
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    Influence of HALO implantation on analog performance and comparison between bulk, partially-depleted and fully-depleted MOSFET's

    Vancaillie, L.
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    Kilchytska, V.
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    Levacq, D.
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    Adriaensen, S.
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    van Meer, Hans
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    De Meyer, Kristin  
    Proceedings paper
    2002, IEEE International SOI Conference, 7/10/2002, p.161-162
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    Investigation of charge control related performances in double-gate SOI MOSFETs

    Kilchytska, V.
    ;
    Chung, T.M.
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    van Meer, Hans
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    De Meyer, Kristin  
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    Raskin, J.P.
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    Flandre, D.
    Proceedings paper
    2003, Silicon-on-Insulator Technology and Devices XI, 28/04/2003, p.225-230
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    Total-dose effects caused by high-energy neutrons and gamma-rays in multiple-gate FETs

    Kilchytska, V.
    ;
    Alvarado, J.
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    Collaert, Nadine  
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    Rooyackers, Rita
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    Militaru, O.
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    Berger, G.
    Journal article
    2010, IEEE Transactions on Nuclear Science, (57) 4, p.1764-1770
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    Total-dose effects caused by high-energy neutrons and g-rays in multiple-gate FETs

    Kilchytska, V.
    ;
    Alvarado, J.
    ;
    Collaert, Nadine  
    ;
    Rooyackers, Rita
    ;
    Militaru, O.
    ;
    Berger, G.
    Proceedings paper
    2009, 10th European Conference on Radiation and Its Effects on Components and Systems - RADECS, 14/09/2009

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