Browsing by Author "Kilchytska, Valeria"
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Publication Back-gate bias effect on FDSOI MOSFET RF figures of merits and parasitic elements
Proceedings paper2017, Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS, 3/04/2017, p.228-230Publication Back-gate bias effect on UTBB-FDSOI non-linearity performance
Proceedings paper2017, 47th European Solid-State Device Research Conference - ESSDERC, 11/09/2017, p.148-151Publication Carrier mobility in undoped triple-gate FinFET structures and limitations of its description in terms of top and sidewall channel mobilities
Journal article2008, IEEE Transactions on Electron Devices, (55) 12, p.3532-3541Publication Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs
Proceedings paper2017, Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS, 3/04/2017, p.128-131Publication Effect of high-energy neutrons on MuGFETs
Proceedings paper2009, 5th EUROSOI Workshop, 19/01/2009, p.139-140Publication Effect of high-energy neutrons on MuGFETs
Journal article2010, Solid-State Electronics, (54) 2, p.196-204Publication Electrical characterization and special properties of FinFET structures
Proceedings paper2007, Nanoscaled Semiconductor-on-Insulator Structures and Devices. Proceedings of the NATO Advanced Research Workshop, 15/10/2006, p.199-220Publication Evidence for substrate bias effects in SOI OmegaFETs
Proceedings paper2008, EUROSOI Workshop Proceedings: 4th Workshop of the Thematic Network on Silicon-on-Insulator Technology, Devices and Circuits, 23/01/2008, p.137-138Publication Experimental study of the effective mobility in doped- and undoped-channel triple-gate FinFET structures
Oral presentation2007, EUROSOI WorkshopPublication FinFETs perspectives for high-temperature applications
Proceedings paper2007-09, 6th HITEN Conference, 17/09/2007Publication Frequency variation of the small-signal output conductance of decananometer MOSFETs due to the substrate crosstalk
Journal article2007-05, IEEE Electron Device Letters, (28) 5, p.419-421Publication Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
Proceedings paper2010, 6th Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI, 25/01/2010, p.119-120Publication High-energy neutrons effect on strained and non-strained SOI MuGFETs
Oral presentation2010, 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREFPublication Perspective of FinFETs for analog applications
Proceedings paper2004, Proceedings of the 34th European Solid-State Device Research Conference - ESSDERC, 20/09/2004, p.65-68Publication Reduction of gate-to-channel tunnelling current in FinFET structures
Journal article2007, Solid-State Electronics, (51) 11_12, p.1466-1473Publication Revised split C-V technique for mobility investigation in advanced devices
Proceedings paper2005, Proceedings of the IEEE International SOI Conference, 3/10/2005, p.110-111Publication Specific features of multi-gate MOSFET threshold voltage and subthreshold slope behavior at high temperatures
Journal article2007, Solid-State Electronics, (51) 9, p.1185-1193Publication Specific features of the capacitance and mobility behaviors in FinFET structures
Proceedings paper2005, Proceedings of the 35th European Solid-State Device Research Conference - ESSDERC, 12/09/2005, p.85-88Publication Study of neutron irradiation effects on SOI and strained SOI MuGFETs assessed by low-frequency noise
Proceedings paper2010, Microelectronics Technology and Devices - SBMICRO 2010, 6/09/2010, p.43-50