Browsing by Author "Kim, Cheolgyu"
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Publication Cost effective FinFET platform for stand alone DRAM 1Y and beyond memory periphery
Proceedings paper2018-01, 2018 IEEE International Memory Workshop (IMW), 13/05/2018, p.1-4Publication Gate-stack engineered NBTI improvements in high-voltage logic-for-memory high-k/metal gate devices
Proceedings paper2019, IEEE International Reliability Physics Symposium - IRPS, 31/03/2019, p.1-8Publication Reliability engineering enabling continued logic for memory device scaling
Proceedings paper2019, 2019 IEEE International Integrated Reliability Workshop (IIRW), 13/10/2019