Browsing by Author "Kim, Y."
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Publication A systematic study of trade-offs in engineering a locally strained pMOSFET
Proceedings paper2004, Technical Digest International Electron Devices Meeting - IEDM, 13/12/2004, p.1055-1058Publication Charge trapping and electron mobility degradation in MOCVD hafnium silicate gate dielectric stack structures
Publication Charge trapping and mobility degradation in MOCVD hafnium silicate gate dielectric stack structures
Publication Layout impact on the performance of a locally strained PMOSFET
Proceedings paper2005, Symposium on VLSI Technology. Digest of Technical Papers, 14/06/2005, p.22-23Publication Study of Ni-Silicide contacts to Si:C source/drain
Journal article2007, Semiconductor Fabtech, 34, p.92-98