Publication:
Charge trapping and mobility degradation in MOCVD hafnium silicate gate dielectric stack structures
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1914 since deposited on 2021-10-15
2last month
Acq. date: 2026-05-19
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Statistics
Views
1914 since deposited on 2021-10-15
2last month
Acq. date: 2026-05-19
Citations