Browsing by Author "Knobloch, Theresia"
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Publication Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
Journal article2023, MICROELECTRONICS RELIABILITY, (146) July, p.Art. 115004Publication Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs
Journal article2024, NPJ 2D MATERIALS AND APPLICATIONS, (8) 1, p.Art. 44Publication Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?
Publication Transistors based on two-dimensional materials for future integrated circuits