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Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs
Publication:
Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs
Date
2024
Journal article
https://doi.org/10.1038/s41699-024-00482-9
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2.73 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Panarella, Luca
;
Kaczer, Ben
;
Smets, Quentin
;
Tyaginov, Stanislav
;
Saraza Canflanca, Pablo
;
Vici, Andrea
;
Verreck, Devin
;
Schram, Tom
;
Lin, Dennis
;
Knobloch, Theresia
;
Grasser, Tibor
;
Lockhart de la Rosa, Cesar Javier
;
Kar, Gouri Sankar
;
Afanasiev, Valeri
Journal
NPJ 2D MATERIALS AND APPLICATIONS
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75
since deposited on 2024-07-31
Acq. date: 2025-10-23
Views
535
since deposited on 2024-07-31
Acq. date: 2025-10-23
Citations
Metrics
Downloads
75
since deposited on 2024-07-31
Acq. date: 2025-10-23
Views
535
since deposited on 2024-07-31
Acq. date: 2025-10-23
Citations