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Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs

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133 since deposited on 2024-07-31
Acq. date: 2026-06-23

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543 since deposited on 2024-07-31
Acq. date: 2026-06-23

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133 since deposited on 2024-07-31
Acq. date: 2026-06-23

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543 since deposited on 2024-07-31
Acq. date: 2026-06-23

Citations