Publication:

Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs

Date

2024
Journal article
https://doi.org/10.1038/s41699-024-00482-9
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dc.contributor.authorPanarella, Luca
dc.contributor.authorKaczer, Ben
dc.contributor.authorSmets, Quentin
dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorSaraza Canflanca, Pablo
dc.contributor.authorVici, Andrea
dc.contributor.authorVerreck, Devin
dc.contributor.authorSchram, Tom
dc.contributor.authorLin, Dennis
dc.contributor.authorKnobloch, Theresia
dc.contributor.authorGrasser, Tibor
dc.contributor.authorLockhart de la Rosa, Cesar Javier
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorAfanasiev, Valeri
dc.contributor.imecauthorPanarella, Luca
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorVici, Andrea
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorSaraza Canflanca, Pablo
dc.contributor.imecauthorLockhart de la Rosa, Cesar Javier
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecTyaginov, Stanislav::0000-0002-5348-2096
dc.contributor.orcidimecVici, Andrea::0000-0002-3614-9590
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecLin, Dennis::0000-0002-1577-6050
dc.contributor.orcidimecSaraza Canflanca, Pablo::0000-0003-2155-8305
dc.contributor.orcidimecLockhart de la Rosa, Cesar Javier::0000-0002-1401-0141
dc.contributor.orcidimecAfanasiev, Valeri::0000-0001-5018-4539
dc.date.accessioned2024-11-21T14:41:21Z
dc.date.available2024-07-31T17:43:17Z
dc.date.available2024-11-21T14:41:21Z
dc.date.embargo2024-04-14
dc.date.issued2024
dc.description.wosFundingTextThis work was done in the imec IIAP core CMOS programs and supported by The Research Foundation-Flanders (FWO grant number: 1S72623N). Fundings were received from the European Union's Horizon 2020 research and innovation programme under grant agreement 952792 (2D-EPL).
dc.identifier.doi10.1038/s41699-024-00482-9
dc.identifier.issn2397-7132
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44239
dc.publisherNATURE PORTFOLIO
dc.source.beginpageArt. 44
dc.source.endpageN/A
dc.source.issue1
dc.source.journalNPJ 2D MATERIALS AND APPLICATIONS
dc.source.numberofpages9
dc.source.volume8
dc.subject.keywordsRANDOM TELEGRAPH NOISE
dc.subject.keywords2-DIMENSIONAL MATERIALS
dc.subject.keywordsDEVICE
dc.title

Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs

dc.typeJournal article
dspace.entity.typePublication
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