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Browsing by Author "Kobayashi, Kazutoshi"

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    An E-mode p-GaN HEMT monolithically-integrated three-level gate driver operating with a single voltage supply

    Nagao, Junichiro
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    Chatterjee, Urmimala  
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    Li, Xiangdong  
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    Furuta, Jun
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    Decoutere, Stefaan  
    Journal article
    2021, IEICE ELECTRONICS EXPRESS, (18) 6, p.20210059
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    Impact of random telegraph noise on ring oscillators evaluated by circuit-level simulations

    Oshima, Azusa
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    Weckx, Pieter  
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    Kaczer, Ben  
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    Kobayashi, Kazutoshi
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    Matsumoto, Takashi
    Proceedings paper
    2015, International Conference on IC Design & Technology - ICICDT, 1/06/2015, p.1-4
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    Monolithic integration of gate driver and p-GaN power HEMT for MHz-switching implemented by e-mode GaN-on-SOI process

    Yamashita, Yuki
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    Stoffels, Steve  
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    Posthuma, Niels  
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    Geens, Karen  
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    Li, Xiangdong  
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    Furuta, Jun
    Journal article
    2019, IEICE Electronics Express, (16) 22, p.20190516
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    Monolithically integrated E-mode GaN-on-SOI gate driver with power GaN-HEMT for MHz-switching

    Yamashita, Yuki
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    Stoffels, Steve  
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    Posthuma, Niels  
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    Decoutere, Stefaan  
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    Kobayashi, Kazutoshi
    Proceedings paper
    2018, IEEE 6th Workshop on Wide Bandgap Power Devices and Applications - WiPDA, 31/10/2018, p.231-236
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    Monolithically integrated GaN power ICs designed using the MIT virtual source GaNFET (MVSG) compact model for enhancement-mode p-GaN gate power HEMTs, logic transistors and resistors

    You, Shuzhen  
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    Li, Xiangdong  
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    Decoutere, Stefaan  
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    Groeseneken, Guido  
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    Chen, Zhanfei
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    Liu, Jun
    Proceedings paper
    2019, 49th European Solid-State Device Research Conference, 23/09/2019, p.158-161
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    Monolithically integrated gate driver for MHz switching with an external inductor as a a current source

    Nagao, Junichiro  
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    Yamashita, Yuki
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    Furuta, Jun
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    Kobayashi, Kazutoshi
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    Stoffels, Steve  
    Proceedings paper
    2019, 2019 20th Workshop on Control and Modeling for Power Electronics (COMPEL), 17/06/2019, p.PS1.19-1-PS1.19-6
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    Physical-based RTN modeling of ring oscillators in 40-nm SiON and 28-nm HKMG by bimodal defect-centric behaviors

    Oshima, Azusa
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    Kobayashi, Kazutoshi
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    Kishida, Ryo
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    Komawako, Takuya
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    Weckx, Pieter  
    ;
    Kaczer, Ben  
    Proceedings paper
    2016, 21st International Conference on Simulation of Semiconductor Processes and Process - SISPAD, 13/06/2016, p.327-330

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