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Browsing by Author "Kohiki, S."

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    Degradation and recovery of In0.53Ga0.47As photodiodes by 1-MeV fast neutrons

    Ohyama, Hidenori
    ;
    Vanhellemont, Jan
    ;
    Takami, Y.
    ;
    Hayama, Kiyoteru
    ;
    Kudou, T.
    ;
    Hakata, T.
    Journal article
    1996, IEEE Transactions on Nuclear Devices, (43) 6, pt.1, p.3019-26
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    Degradation of InGaAs pin photodiodes by neutron irradiation

    Ohyama, Hidenori
    ;
    Vanhellemont, Jan
    ;
    Takami, Y.
    ;
    Hayama, Kiyoteru
    ;
    Kudou, T.
    ;
    Kohiki, S.
    Journal article
    1996, Semiconductor Science and Technology, (11) 10, p.1461-1463
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    Radiation damage of N-MOSFETS fabricated in a BiCMOS process

    Kobayashi, K.
    ;
    Ohyama, Hidenori
    ;
    Yoneoka, M.
    ;
    Hayama, Kiyoteru
    ;
    Nakabayashi, M.
    ;
    Simoen, Eddy  
    Journal article
    2001, Journal of Materials Science: Materials in Electronics, (12) 4_6, p.227-230
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    Radiation damage of n-MOSFETs fabricated in a BiCMOS process

    Ohyama, Hidenori
    ;
    Kobayashi, K.
    ;
    Nakabayashi, M.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Takami, Y.
    Proceedings paper
    2000, 3rd International Conference Materials for Microelectronics, 16/10/2000, p.107-110

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