Browsing by Author "Kohiki, S."
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Publication Degradation and recovery of In0.53Ga0.47As photodiodes by 1-MeV fast neutrons
;Ohyama, Hidenori ;Vanhellemont, Jan ;Takami, Y. ;Hayama, Kiyoteru ;Kudou, T.Hakata, T.Journal article1996, IEEE Transactions on Nuclear Devices, (43) 6, pt.1, p.3019-26Publication Degradation of InGaAs pin photodiodes by neutron irradiation
;Ohyama, Hidenori ;Vanhellemont, Jan ;Takami, Y. ;Hayama, Kiyoteru ;Kudou, T.Kohiki, S.Journal article1996, Semiconductor Science and Technology, (11) 10, p.1461-1463Publication Radiation damage of N-MOSFETS fabricated in a BiCMOS process
Journal article2001, Journal of Materials Science: Materials in Electronics, (12) 4_6, p.227-230Publication Radiation damage of n-MOSFETs fabricated in a BiCMOS process
Proceedings paper2000, 3rd International Conference Materials for Microelectronics, 16/10/2000, p.107-110