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Browsing by Author "Kol'dyaev, Victor"

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    0.13µm CMOS technology with optimized poly-Si / NO-oxide gate stack

    Kubicek, Stefan  
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    Jansen, Philippe
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    Badenes, Gonçal
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    Schaekers, Marc  
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    Kol'dyaev, Victor
    Proceedings paper
    1999, ULSI Process Integration. Proceedings of the First International Symposium, 17/10/1999, p.193-202
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    A comprehensive closed-form model for the quantized accumulation layer in MOS structures

    Kol'dyaev, Victor
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    Van den Bosch, Geert  
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    Deferm, Ludo  
    Journal article
    1998, Solid-State Electronics, (42) 1, p.49-56
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    A comprehensive model of a VLSI spiral inductor from the first principles

    Kol'dyaev, Victor
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    Decoutere, Stefaan  
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    Kuhn, Rudiger
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    Deferm, Ludo  
    Proceedings paper
    1998, Simulation of Semiconductor Processes and Devices 1998 - SISPAD 98, 2/09/1998, p.34-37
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    A high-accuracy comprehensive high-frequency model of a VLSI spiral inductor

    Kol'dyaev, Victor
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    Decoutere, Stefaan  
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    Kuhn, Rudiger
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    Deferm, Ludo  
    Proceedings paper
    1998, Proceedings of the 28th European Solid-State Device Research Conference - ESSDERC'98; 8-10 Sept. 1998; Bordeaux, France., p.640-643
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    Characterisation of the overlap capacitance of submicron LDD MOSFETs

    Kol'dyaev, Victor
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    Clerix, Andre  
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    Murphy, Roberto
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    Deferm, Ludo  
    Proceedings paper
    1995, 25th European Solid State Device Research Conference - ESSDERC, 25/09/1995, p.757-760
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    Closed-form frequency dependent gate-to-channel capacitance model for submicron MOSFET's

    Kol'dyaev, Victor
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    Clerix, Andre  
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    Deferm, Ludo  
    Proceedings paper
    1996, Proceedings of the 26th European Solid-State Device Research Conference - ESSDERC, 9/09/1996, p.679-82
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    Closed-form model of the subhalfmicrometer LDD MOSFET overlap capacitance

    Kol'dyaev, Victor
    ;
    Deferm, Ludo  
    Proceedings paper
    1997, ESSDERC '97: Proceedings of the 27th European Solid-State Device Research Conference, 22/09/1997, p.668-671
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    Gate stack optimisation for advanced CMOS process

    Kubicek, Stefan  
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    Vandenberghe, Geert  
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    Schaekers, Marc  
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    Kol'dyaev, Victor
    ;
    Jansen, Philippe
    Proceedings paper
    1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.412-415
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    Impact of substrate resistivity on the high frequency performance of metal interconnect

    Jenei, Snezana
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    Kol'dyaev, Victor
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    Decoutere, Stefaan  
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    Kuhn, Rudiger
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    Deferm, Ludo  
    Proceedings paper
    1999, Proceedings of the International Interconnect Technology Conference - IITC; San Francisco, CA, USA., p.242-244
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    Impact of the gradient of the non-equilibrium point defect concentration on the dopant flux in silicon

    Kol'dyaev, Victor
    Proceedings paper
    1995, 18th International Semiconductor Conference. CAS'95 Proceedings, 10/10/1995, p.125-128
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    Impact of the transmission line properties of a metal-ultrathin silicon dioxide-semiconductor field-effect transistor on the extracted inversion-layer thickness

    Kol'dyaev, Victor
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    Clerix, Andre  
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    Deferm, Ludo  
    ;
    Van Overstraeten, Roger
    Journal article
    1998, Journal of Applied Physics, (83) 4, p.2131-2138
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    Non-linear Frenkel and Pool effects

    Kol'dyaev, Victor
    Proceedings paper
    1997, Noise in Physical Systems and 1/f Fluctuations: Proceedings of the 14th International Conference, 14/07/1997, p.633-636
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    Nonlinear Frenkel and Poole effects

    Kol'dyaev, Victor
    Journal article
    1999, Philsophical Magazine B, (79) 2, p.331-342
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    Study of the influence of the nonequilibrium point defect concentration gradient on the dopant flux during ion implantation in silicon at high temperatures

    Kol'dyaev, Victor
    Journal article
    1995, Nuclear Instruments and Methods in Physics Research B, (103) 4, p.446-53

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