Browsing by Author "Kolodinski, Sabine"
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Publication Characterization of ultra-thin PtSi films for infrared detectors
Proceedings paper1996, Silicide Thin Films - Fabrication, Properties, and Applications, 27/11/1995, p.449-454Publication CoSi2Si1-xGx-interfaces for Schottky barrier infrared detectors with extended detection regime
Proceedings paper1995, Growth and Characterization of Materials for Infrared Detectors II, 13/07/1995, p.175-84Publication Electro-optical characterization of epitaxial and polycrystalline CoSi2 Schottky diodes
Proceedings paper1995, Infrared Technology XXI; 9-13 July 1995; San Diego, CA, USA., p.465-61Publication Formation of CoSi2 on strained Si0.8Ge0.2 using a sacrificial Si layer
Journal article1995, Applied Surface Science, 91, p.77-81Publication Increase in the infrared response of silicide schottky barrier diodes by grain boundary scattering
Journal article1995, Appl. Phys. Lett., (67) 10, p.1372-1374Publication Influence of grain boundary scattering in the infrared response of silicide Schottky barrier diodes
Journal article1996, Journal of Appl Physics, (79) 8, p.4426-4430Publication Infrared response of epitaxial and polycrystalline CoSi2 Schottky diodes
Journal article1998, Materials Science and Technology, (14) 12, p.1303-1306Publication New process for controlled formation of ultra-thin PtSi films for infra-red detector applications
Proceedings paper1995, Growth and Characterization of Materials for Infrared Detectors II, 13/07/1995, p.185-190