Publication:

New process for controlled formation of ultra-thin PtSi films for infra-red detector applications

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1994 since deposited on 2021-09-29
Acq. date: 2025-10-22

Citations

Metrics

Views

1994 since deposited on 2021-09-29
Acq. date: 2025-10-22

Citations