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Characterization of ultra-thin PtSi films for infrared detectors
Publication:
Characterization of ultra-thin PtSi films for infrared detectors
Date
1996
Proceedings Paper
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1054.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bender, Hugo
;
Roussel, Philippe
;
Kolodinski, Sabine
;
Torres Jacome, Alfonso
;
Alves Donaton, Ricardo
;
Maex, Karen
;
van der Sluis, P.
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1
since deposited on 2021-09-29
Acq. date: 2025-10-22
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1962
since deposited on 2021-09-29
Acq. date: 2025-10-22
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Metrics
Downloads
1
since deposited on 2021-09-29
Acq. date: 2025-10-22
Views
1962
since deposited on 2021-09-29
Acq. date: 2025-10-22
Citations