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Browsing by Author "Komori, Kana"

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    Cleaning the high aspect ratio STI structures for advanced logic devices by implementation of a surface modification drying technique

    Sebaai, Farid  
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    Vereecke, Guy  
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    Xu, XiuMei  
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    Baudot, Sylvain  
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    Amemiya, Fumihiro
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    Komori, Kana
    Meeting abstract
    2018, Ultra Clean Processing of Semiconductor Surfaces XIV - UCPSS, 2/09/2018, p.190-193
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    Dry removal of a surface functionalization chemistry used for pattern collapse prevention

    Vereecke, Guy  
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    Komori, Kana
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    Nakano, Yuta
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    Sebaai, Farid  
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    Xu, XiuMei  
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    Oniki, Yusuke  
    Meeting abstract
    2018, Surface Preparation & Cleaning Conference - SPCC, 10/04/2018
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    Pre-Epi Clean of SiGe 20%: GeH4 and HCl vs H2-based in-situ cleaning

    Wostyn, Kurt  
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    Dhayalan, Sathish Kumar
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    Gencarelli, Federica
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    Masaoku, Toru
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    Iino, Hideaki
    Meeting abstract
    2018-05, 9th International SiGe Technology and Device Meeting / 11th International Conference on Silicon Epitaxy and Heterostructures, 27/05/2018, p.193-194
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    SiGe vs. Si selective wet etchingfor Si gate-all-around

    Komori, Kana
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    Rip, Jens  
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    Yoshida, Yukifumi
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    Wostyn, Kurt  
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    Sebaai, Farid  
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    Liu, Wen Dar
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    Lee, Yi Chia
    Proceedings paper
    2018, Ultra Clean Processing of Semiconductor Surfaces XIV - UCPSS, 2/09/2018, p.107-112
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    Study of SiGe cleaning

    Komori, Kana
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    Wostyn, Kurt  
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    Rondas, Dirk  
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    Loyo Prado, Jana  
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    Conard, Thierry  
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    Loo, Roger  
    Proceedings paper
    2017, 232nd ECS Meeting: 15th International Symposium on Semiconductor Cleaning and Technology - SCST15, 1/10/2017, p.141-146

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