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SiGe vs. Si selective wet etchingfor Si gate-all-around
Publication:
SiGe vs. Si selective wet etchingfor Si gate-all-around
Date
2018
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Komori, Kana
;
Rip, Jens
;
Yoshida, Yukifumi
;
Wostyn, Kurt
;
Sebaai, Farid
;
Liu, Wen Dar
;
Lee, Yi Chia
;
Sekiguchi, Ryo
;
Mertens, Hans
;
Hikavyy, Andriy
;
Holsteyns, Frank
;
Horiguchi, Naoto
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1916
since deposited on 2021-10-25
Acq. date: 2025-10-27
Citations
Metrics
Views
1916
since deposited on 2021-10-25
Acq. date: 2025-10-27
Citations