Browsing by Author "Kulisch, W."
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Publication Characterization of conductive probes for atomic force microscopy
Proceedings paper1999, Design, Test, and Microfabrication of MEMS and MOEMS; 30 March - 1 April 1999; Paris, France., 30/03/1999, p.1168-1179Publication Diamond tips and cantilevers for the characterization of semiconductor devices
Journal article1999, Diamond and Related Materials, (8) 2_5, p.283-287Publication Evaluating probes for "electrical" atomic force microscopy
Proceedings paper1999, Proceedings 5th International Workshop on the Measurement, Characterization, and Modeling of Ultra-Shallow Doping Profiles in Se, 28/03/1999, p.423-436Publication Evaluating probes for "electrical" atomic force microscopy
Journal article2000, J. Vacuum Science and Technology B, (B18) 1, p.418-427Publication Tip-on-tip: a novel AFM tip configuration for the electrical characterization of semiconductor devices
Oral presentation1998, MNE 98 - Micro- and Nano-Engineering Conference; 22-24 Sept. 1998; Leuven, Belgium.Publication Tip-on-tip: a novel AFM tip configuration for the electrical characterization of semiconductor devices
Journal article1999, Microelectronic Engineering, (46) 1_4, p.113-116