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Evaluating probes for "electrical" atomic force microscopy
Publication:
Evaluating probes for "electrical" atomic force microscopy
Date
2000
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Trenkler, Thomas
;
Hantschel, Thomas
;
Stephenson, Robert
;
De Wolf, Peter
;
Vandervorst, Wilfried
;
Hellemans, L.
;
Malavé, A.
;
Büchel, D.
;
Oesterschulze, E.
;
Kulisch, W.
;
Niedermann, P.
;
Sulzbach, T.
;
Ohlsson, O.
Journal
J. Vacuum Science and Technology B
Abstract
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1966
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1966
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations