Publication:

Evaluating probes for "electrical" atomic force microscopy

Date

2000
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorTrenkler, Thomas
dc.contributor.authorHantschel, Thomas
dc.contributor.authorStephenson, Robert
dc.contributor.authorDe Wolf, Peter
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorHellemans, L.
dc.contributor.authorMalavé, A.
dc.contributor.authorBüchel, D.
dc.contributor.authorOesterschulze, E.
dc.contributor.authorKulisch, W.
dc.contributor.authorNiedermann, P.
dc.contributor.authorSulzbach, T.
dc.contributor.authorOhlsson, O.
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.date.accessioned2021-10-14T13:55:12Z
dc.date.available2021-10-14T13:55:12Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4798
dc.source.beginpage418
dc.source.endpage427
dc.source.issue1
dc.source.journalJ. Vacuum Science and Technology B
dc.source.volumeB18
dc.title

Evaluating probes for "electrical" atomic force microscopy

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
4799.pdf
Size:
678.02 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles