Browsing by Author "Kundu, Paromita"
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Publication Advanced 3D characterisation of semiconductor devices: hybrid metrology correlating STEM-EDXS and atom probe tomography
Proceedings paper2018, 19th International Microscopy Congress - IMC19, 9/09/2018Publication Combined STEM-EDS tomography of nanowire structures
Journal article2019, Semiconductor Science and Technology, (34) 11, p.114002-1-114002-12Publication Combined STEM-EDS tomography of nanowire structures
Proceedings paper2019, Microscopy of Semiconducting Materials, MSM XXI, 9/04/2019Publication Efficient long-range conduction in cable bacteria through nickel protein wires
Publication TEM investigation of gate-all-around nanowire devices
; ; ; ; ; Meeting abstract2019, Microscopy of Semiconducting Materials (MSM-XXI), 9/04/2019Publication TEM investigations of gate-all-around nanowire devices
; ; ; ; ; Journal article2019, Semiconductor Science and Technology, (34) 12, p.124003