Browsing by Author "Kuppuswamy, Vijaya-Kumar Murugesan"
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Publication Contact edge roughness and CD uniformity in EUV: effect of photo acid generator and sensitizer
;Kuppuswamy, Vijaya-Kumar Murugesan ;Constantoudis, VassiliosGogolides, EvangelosProceedings paper2012, Extreme Ultraviolet (EUV) Lithography III, 12/02/2012, p.832207Publication Contact-edge roughness (CER) characterization and modeling: effect of dose on CER and crtitical dimension uniformity
;Kuppuswamy, Vijaya-Kumar Murugesan ;Constantoudis, VassiliosGogolides, EvangelosProceedings paper2011, Metrology, Inspection, and Process Control XXV, 27/02/2011, p.79710Q