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Browsing by Author "Lauwaert, Ralph"

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    Board-level solder intermetallic strength measurements using mini-Charpy shock testing and FEM calibration

    Labie, Riet  
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    Duflos, Frederic
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    Vandevelde, Bart  
    ;
    Allaert, Bart
    ;
    Lauwaert, Ralph
    ;
    Willems, Geert  
    Proceedings paper
    2018, 19th Int. Conf. Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics & Microsysystems - EuroSimE, 16/04/2018, p.1-6
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    Effect of a ductile, low melting point alloy on the hot tear defect on lead-free ball grid arrays

    Teliszewski, Steven
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    Lauwaert, Ralph
    ;
    Vandevelde, Bart  
    Proceedings paper
    2020, SMTA International, 28/09/2020, p.#454
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    ENHANCED PROCESSABILITY AND THERMAL FATIGUE RELIABILITY WITH LOW MELTING POINT SNBI SOLDER ALLOY LMPA-Q

    Vandevelde, Bart  
    ;
    Nawghane, Chinmay  
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    Labie, Riet  
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    Lauwaert, Ralph
    ;
    Werkhoven, Daniel
    Proceedings paper
    2021, ASME International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (InterPACK), OCT 26-28, 2021
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    Four-point bending cycling as alternative for thermal cycling solder fatigue testing

    Vandevelde, Bart  
    ;
    Vanhee, Filip
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    Pissoort, Davy
    ;
    Degrendele, Lieven  
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    De Baets, Johan  
    Proceedings paper
    2016-04, 17th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectr. and Microsyst. - EuroSimE, 17/04/2016
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    Four-point bending cycling: The alternative for thermal cycling solder fatigue testing of electronic components

    Vandevelde, Bart  
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    Vanhee, Filip
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    Pissoort, Davy
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    Degrendele, Lieven  
    ;
    De Baets, Johan  
    Journal article
    2017, Microelectronics Reliability, 74, p.131-135
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    How the mold compound thermal expansion overrules the solder composition choice in board level reliability performance

    Vandevelde, Bart  
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    Degrendele, Lieven  
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    Cauwe, Maarten  
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    Allaert, Bart
    ;
    Lauwaert, Ralph
    Proceedings paper
    2016-04, International Conference on Electronics Packaging - ICEP, 20/04/2016, p.94-98
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    Impact of pad finish on mechanical shock resistance of lead-free solder joints tested under shear and in pull mode

    Vandevelde, Bart  
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    Van Kerckhove, Matthias
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    Degryse, Dominiek
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    D'Haese, Wim
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    Schaubroeck, David  
    Proceedings paper
    2013, European Microelectronics and Packaging Conference - EMPC, 9/09/2013
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    Improved QFN thermal cycling reliability using low melting temperature SnBi based solder paste LMPA-Q

    Vandevelde, Bart  
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    Labie, Riet  
    ;
    Lauwaert, Ralph
    ;
    Werkhoven, Daniel
    ;
    Vanderstraeten, Daniel
    Proceedings paper
    2019, 20th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, 24/03/2019, p.1-5
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    Investigation of solder joint deformation under thermo-mechanical loading using DIC techniques

    Eichhorst, Michael
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    Seiler, B.
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    Scheiter, L.
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    Vandevelde, Bart  
    ;
    Lauwaert, Ralph
    Proceedings paper
    2020, EuWoRel Workshop, 21/10/2020
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    Strain Measurements and Thermo-Mechanical Simulation of SnAgCu vs. low melting point alloy (LMPA-Q) solder joints

    Vandevelde, Bart  
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    Labie, Riet  
    ;
    Lauwaert, Ralph
    ;
    Dudek, Rainer
    ;
    Gromala, Przemyslaw
    Proceedings paper
    2023, 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), APR 16-19, 2023

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