Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Four-point bending cycling: The alternative for thermal cycling solder fatigue testing of electronic components
Publication:
Four-point bending cycling: The alternative for thermal cycling solder fatigue testing of electronic components
Date
2017
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandevelde, Bart
;
Vanhee, Filip
;
Pissoort, Davy
;
Degrendele, Lieven
;
De Baets, Johan
;
Allaert, Bart
;
Lauwaert, Ralph
;
Zanon, Franco
;
Labie, Riet
;
Willems, Geert
Journal
Microelectronics Reliability
Abstract
Description
Metrics
Views
2084
since deposited on 2021-10-24
Acq. date: 2025-10-27
Citations
Metrics
Views
2084
since deposited on 2021-10-24
Acq. date: 2025-10-27
Citations