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Browsing by Author "Lederer, Dimitri"

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    Accurate effective mobility extraction by split C-V technique in SOI MOSFETs: suppression of the influence of floating-body effects

    Kilchytska, Valeriya
    ;
    Lederer, Dimitri  
    ;
    Collaert, Nadine  
    ;
    Jean-Pierre, Raskin
    ;
    Flandre, Denis
    Journal article
    2005-10, IEEE Electron Device Letters, (26) 10, p.749-751
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    CMOS compatible GaN-on-Si HEMT technology for RF applications: analysis of substrate losses and non-linearities

    Yadav, Sachin  
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    Cardinael, Pieter
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    Zhao, Ming  
    ;
    Vondkar Kodandarama, Komal  
    Proceedings paper
    2021, International Conference on IC Design and Technology (ICICDT), SEP 15-17, 2021
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    FinFET analogue characterization from DC to 110 GHz

    Lederer, Dimitri  
    ;
    Kilchytska, V.
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    Rudenko, T.
    ;
    Collaert, Nadine  
    ;
    Flandre, D.
    ;
    Dixit, Abhisek
    Journal article
    2005, Solid-State Electronics, (49) 5, p.1488-1496
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    Frequency variation of the small-signal output conductance of decananometer MOSFETs due to the substrate crosstalk

    Kilchytska, Valeria
    ;
    Pailloncy, G.
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    Lederer, Dimitri  
    ;
    Raskin, Jean-Pierre
    ;
    Collaert, Nadine  
    Journal article
    2007-05, IEEE Electron Device Letters, (28) 5, p.419-421
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    High-frequency noise performance of 60-nm gate-length FinFETs

    Raskin, Jean-Pierre
    ;
    Pailloncy, Guillaume
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    Lederer, Dimitri  
    ;
    Danneville, Francois
    Journal article
    2008, IEEE Transactions on Electron Devices, (55) 10, p.2718-2727
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    Perspective of FinFETs for analog applications

    Kilchytska, Valeria
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    Collaert, Nadine  
    ;
    Rooyackers, Rita
    ;
    Lederer, Dimitri  
    ;
    Raskin, Jean-Pierre
    Proceedings paper
    2004, Proceedings of the 34th European Solid-State Device Research Conference - ESSDERC, 20/09/2004, p.65-68
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    Revised split C-V technique for mobility investigation in advanced devices

    Kilchytska, Valeria
    ;
    Lederer, Dimitri  
    ;
    Simon, P.
    ;
    Collaert, Nadine  
    ;
    Raskin, Jean-Pierre
    Proceedings paper
    2005, Proceedings of the IEEE International SOI Conference, 3/10/2005, p.110-111
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    Time Dependence of RF Losses in GaN-on-Si Substrates

    Cardinael, Pieter
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    Yadav, Sachin  
    ;
    Zhao, Ming  
    ;
    Rack, Martin
    ;
    Lederer, Dimitri
    ;
    Collaert, Nadine  
    Journal article
    2022-04-11, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, (32) 6, p.688-691

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