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CMOS compatible GaN-on-Si HEMT technology for RF applications: analysis of substrate losses and non-linearities
Publication:
CMOS compatible GaN-on-Si HEMT technology for RF applications: analysis of substrate losses and non-linearities
Date
2021
Proceedings Paper
https://doi.org/10.1109/ICICDT51558.2021.9626530
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yadav, Sachin
;
Cardinael, Pieter
;
Zhao, Ming
;
Vondkar Kodandarama, Komal
;
Peralagu, Uthayasankaran
;
Alian, Alireza
;
Khaled, Ahmad
;
Makovejev, Sergej
;
Ekoga, Enrique
;
Lederer, Dimitri
;
Raskin, Jean-Pierre
;
Parvais, Bertrand
;
Collaert, Nadine
Journal
na
Abstract
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1608
since deposited on 2022-09-19
Acq. date: 2025-10-25
Citations
Metrics
Views
1608
since deposited on 2022-09-19
Acq. date: 2025-10-25
Citations