Browsing by Author "Li, Zhigang"
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Publication A comparative study of defect energy distribution and its impact on degradation kinetics in GeO2/Ge and SiON/Si pMOSFETs
Journal article2016, IEEE Transactions on Electron Devices, (63) 10, p.3830-3836Publication New analysis method for time-dependent device-to-device variation accounting for within-device fluctuation
Journal article2013, IEEE Transactions on Electron Devices, (60) 8, p.2505-2511