Publication:
A comparative study of defect energy distribution and its impact on degradation kinetics in GeO2/Ge and SiON/Si pMOSFETs
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1976 since deposited on 2021-10-23
1last week
Acq. date: 2025-10-28
Citations
Metrics
Views
1976 since deposited on 2021-10-23
1last week
Acq. date: 2025-10-28
Citations