Publication:
A comparative study of defect energy distribution and its impact on degradation kinetics in GeO2/Ge and SiON/Si pMOSFETs
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1979 since deposited on 2021-10-23
2last month
Acq. date: 2025-12-11
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Metrics
Views
1979 since deposited on 2021-10-23
2last month
Acq. date: 2025-12-11
Citations