Browsing by Author "Liang, Chundong"

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Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

Jiang, Rong
;
Zhang, En Xia
;
Liao, Wenjun
;
Liang, Chundong
;
Fleetwood, Daniel
;
Schrimpf, Ronald
Journal article
2018, IEEE Transactions on Nuclear Science, (65) 1, p.175-183
Total ionizing dose effects on strained Ge pMOS FinFETs on bulk Si

Mitard, Jerome
;
Zhang, En Xia
;
Fleetwood, Daniel
;
Hachtel, Jordan
;
Liang, Chundong
;
Reed, Robert
Meeting abstract
2016-07, IEEE Nuclear Space and Radiation Conference - NSREC, 13/07/2016