Browsing by Author "Liu, Hua-Yu"
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Publication Aerial image simulations of soft and phase defects in 193-nm lithography for 10-nm node
Proceedings paper2002, Optical Microlithography XV, 5/03/2002, p.1180-1189Publication OPC resist model separability validation after SMO source change
Proceedings paper2013, Optical Microlithography XXVI, 24/02/2013, p.86831BPublication Separable models for computational lithography
;Liu, Hua-Yu ;Zhao, Q. ;Chen, J.F. ;Jiang, J. ;Socha, B. ;Van Setten, E. ;Engelen, A.Meessen, J.Proceedings paper2008, Photomask and Next-Generation Lithography Mask Technology XV, 16/04/2008, p.70280X