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Browsing by Author "Lucci, Luca"

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    Polarity dependent charge trapping in thin SiO2/Al2O3 gate staks with poly-Si gate electrodes: influence of high temperature annealing

    Lucci, Luca
    ;
    Pantisano, Luigi
    ;
    Cartier, Eduard
    ;
    Kerber, Andreas
    ;
    Groeseneken, Guido  
    ;
    Ho, M.Y.
    Oral presentation
    2002, 33rd IEEE Semiconductor Interface Specialists Conference - SISC
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    Scaling of high-k dielectrics towards sub-1nm EOT

    Heyns, Marc  
    ;
    Beckx, Stephan  
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    Bender, Hugo  
    ;
    Blomme, Pieter  
    ;
    Boullart, Werner  
    ;
    Brijs, Bert
    Proceedings paper
    2003, IEEE International Symposium on VLSI Technology, Systems, and Applications, 23/04/2003, p.251-254

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