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Scaling of high-k dielectrics towards sub-1nm EOT
Publication:
Scaling of high-k dielectrics towards sub-1nm EOT
Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Heyns, Marc
;
Beckx, Stephan
;
Bender, Hugo
;
Blomme, Pieter
;
Boullart, Werner
;
Brijs, Bert
;
Carter, Richard
;
Caymax, Matty
;
Claes, Martine
;
Conard, Thierry
;
De Gendt, Stefan
;
Degraeve, Robin
;
Delabie, Annelies
;
Deweerd, Wim
;
Groeseneken, Guido
;
Henson, Kirklen
;
Kauerauf, Thomas
;
Kubicek, Stefan
;
Lucci, Luca
;
Lujan, Guilherme
;
Mentens, Jimmy
;
Pantisano, Luigi
;
Petry, Jasmine
;
Richard, Olivier
;
Röhr, Erika
;
Schram, Tom
;
Vandervorst, Wilfried
;
Van Doorne, Patrick
;
Van Elshocht, Sven
;
Westlinder, Jörgen
;
Witters, Thomas
;
Zhao, Chao
;
Cartier, Eduard
;
Chen, Jerry
;
Cosnier, Vincent
;
Green, Martin
;
Jang, Se Aug
;
Kaushik, Vidya
;
Kerber, Andreas
;
Kluth, Jon
;
Lin, Steven
;
Tsai, Wilman
;
Young, Edward
;
Manabe, Yukiko
;
Shimamoto, Yasuhiro
;
Bajolet, Philippe
;
De Witte, Hilde
;
Maes, Jan
;
Date, Lucien
;
Pique, Didier
;
Coenegrachts, Bart
;
Vertommen, Johan
;
Passefort, Sophie
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1961
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1961
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations