Browsing by Author "Lyu, Jeong-ho"
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Publication Explanation of the "long distance" Vt roll-off in deep submicron nMOS transistors with Indium channel
Proceedings paper1998, Proceedings of the 28th European Solid-State Device Research Conference - ESSDERC'98; 8-10 Sept. 1998; Bordeaux, France., p.368-371Publication High performance raised gate/source/drain transistors for sub-0.15 μm CMOS technologies
Proceedings paper1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.388-391Publication Investigation of the threshold voltage difference between partially-depleted SOI and bulk CMOS transistors
Proceedings paper1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.372-375Publication Limitations of shift-and-ratio based Leff extraction techniques for MOS transistors with halo or pocket implants
Journal article2000, IEEE Electron Device Letters, (21) 3, p.133-136Publication On the impact of indium and boron on the Reversed Narrow-Channel Effects (RNCE) in BULK and SOI MOSFETs
Proceedings paper1999, 1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Tevhnical Papers; 8-10 June 1999; Tai, p.31-34Publication Optimization of nMOS high-frequency transistor characteristics for application in MMIC's
Proceedings paper1998, 1998 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, 17/09/1998, p.72-76Publication Performance of 0.1 μm partially-depleted SOI CMOS: a comparison to bulk
Proceedings paper2000, Proceedings of the Silicon on Insulator Development and Application Workshop; 6-7 September 2000., p.2.2Publication Threshold voltage design incompatibility between partially-depleted SOI and bulk CMOS transistors
Proceedings paper1999, Proceedings of the IEEE SOI Conference; October 1999; Rohnert Parc, Ca, USA., p.32-33Publication Versatile RF measurement system to thoroughly evaluate the non-linear behaviour of SOI versus bulk CMOS technologies
Proceedings paper1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.376-379