Publication:

Limitations of shift-and-ratio based Leff extraction techniques for MOS transistors with halo or pocket implants

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1914 since deposited on 2021-10-14
2last month
Acq. date: 2025-12-16

Citations

Metrics

Views

1914 since deposited on 2021-10-14
2last month
Acq. date: 2025-12-16

Citations