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Limitations of shift-and-ratio based Leff extraction techniques for MOS transistors with halo or pocket implants
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Limitations of shift-and-ratio based Leff extraction techniques for MOS transistors with halo or pocket implants
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Date
2000
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
van Meer, Hans
;
Henson, Kirklen
;
Lyu, Jeong-ho
;
Rosmeulen, Maarten
;
Kubicek, Stefan
;
Collaert, Nadine
;
De Meyer, Kristin
Journal
IEEE Electron Device Letters
Abstract
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1914
since deposited on 2021-10-14
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last month
Acq. date: 2025-12-16
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Metrics
Views
1914
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-16
Citations