Browsing by Author "Ma, J."
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Publication AC NBTI of Ge pMOSFETs: impact of energy alternating defects on lifetime prediction
Proceedings paper2015, IEEE Symposium on VLSI Technology, 15/06/2015, p.T34-T35Publication Characterization of negative-bias temperature instability of Ge MOSFETs with GeO2/Al2O3 stack