Browsing by Author "Ma, X."
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Publication An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method
; Publication Insights into the effect of TiN thickness scaling on DC and AC NBTI characteristics in replacement metal gate pMOSFETs
; Publication Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability
Proceedings paper2019-04, IEEE International Reliability Physics Symposium (IRPS), 31/03/2019, p.4D4.1-4D4.10Publication Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs
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