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Browsing by Author "Matsubayashi, Daisuke"

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    Accurate off-current evaluation by parasitic capacitance extraction in capacitor-less DRAM cells

    Matsubayashi, Daisuke  
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    Subhechha, Subhali  
    ;
    Oh, Hyungrock  
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    Rassoul, Nouredine  
    Proceedings paper
    2025, IEEE International Memory Workshop (IMW), 2025-05-18, p.13-16
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    Band Tail State Broadening in IGZO TFTs After pBTI-Induced Negative VT Shift Revealed via DC and 1/f Noise Measurements

    Asanovski, Ruben  
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    Rinaudo, Pietro  
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    Vaisman Chasin, Adrian  
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    Zhao, Ying  
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    Dekkers, Harold  
    Journal article
    2026, IEEE ELECTRON DEVICE LETTERS, (47) 5, p.929-932
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    First Systematic Characterization of Floating Body Effects in GAA Nanosheet 3D DRAM Access Transistors

    Garbin, Daniele  
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    Eneman, Geert  
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    Ritzenthaler, Romain  
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    Rassoul, Nouredine  
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    Eyben, Pierre  
    Proceedings paper
    2025, IEEE International Electron Devices Meeting (IEDM), 2025-12-06
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    First-principles screening for sustainable OTS materials

    Clima, Sergiu  
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    Matsubayashi, Daisuke  
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    Ravsher, Taras  
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    Garbin, Daniele  
    ;
    Delhougne, Romain  
    Journal article
    2024, SOLID-STATE ELECTRONICS, (214) April, p.Art. 108876
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    Improving IGZO transistor PBTI reliability with hydrogen anneal achieving overdrive voltage of 1.2V for a lifetime of 5 years at 95°C

    Vaisman Chasin, Adrian  
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    Franco, Jacopo  
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    Matsubayashi, Daisuke  
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    Tyaginov, Stanislav  
    Proceedings paper
    2025, IEEE International Electron Devices Meeting (IEDM), 2025-12-06
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    In silico screening for As/Se-free ovonic threshold switching materials

    Clima, Sergiu  
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    Matsubayashi, Daisuke
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    Ravsher, Taras  
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    Garbin, Daniele  
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    Delhougne, Romain  
    Journal article
    2023, NPJ COMPUTATIONAL MATERIALS, (9) 1, p.Art. 96
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    In-Poor IGZO: Superior Resilience to Hydrogen in Forming Gas Anneal and PBTI

    Kruv, Anastasiia  
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    van Setten, Michiel  
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    Vaisman Chasin, Adrian  
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    Matsubayashi, Daisuke  
    Journal article
    2025, ACS APPLIED ELECTRONIC MATERIALS, (7) 9, p.4210-4219
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    OTS Physics-based Screening for Environment-friendly Selector Materials

    Matsubayashi, Daisuke  
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    Clima, Sergiu  
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    Ravsher, T.
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    Garbin, Daniele  
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    Delhougne, Romain  
    Proceedings paper
    2022, International Electron Devices Meeting (IEDM), DEC 03-07, 2022
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    Pathways for Retention Boost in Atomic Layer Etched IGZO-Based Capacitorless DRAM

    Izukashi, K.
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    Matsubayashi, Daisuke  
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    Belmonte, Attilio  
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    Kundu, Souvik  
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    Wan, Yiqun  
    Journal article
    2025, IEEE ELECTRON DEVICE LETTERS, (46) 7, p.1111-1114
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    The Impact of Process Steps on Nearly Ideal Subthreshold Slope in 300-mm Compatible InGaZnO TFTs

    Tang, Hongwei  
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    Lin, Dennis  
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    Subhechha, Subhali  
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    Vaisman Chasin, Adrian  
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    Matsubayashi, Daisuke  
    Journal article
    2025, IEEE ELECTRON DEVICE LETTERS, (46) 5, p.761-764
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    Understanding the Cycling-Dependent Threshold Voltage Instability in OTS Devices

    Yamaguchi, Marina  
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    Degraeve, Robin  
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    Garbin, Daniele  
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    Clima, Sergiu  
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    Ravsher, Taras  
    Proceedings paper
    2022, International Electron Devices Meeting (IEDM), DEC 03-07, 2022
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    Unraveling BTI in IGZO devices: impact of device architecture, channel film deposition method and stoichiometry/phase, and device operating conditions

    Vaisman Chasin, Adrian  
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    Franco, Jacopo  
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    Van Beek, Simon  
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    Dekkers, Harold  
    ;
    Kruv, Anastasiia  
    Proceedings paper
    2024, IEEE International Electron Devices Meeting (IEDM), 2024-12-07

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