Browsing by Author "Mavrou, G."
Now showing 1 - 5 of 5
- Results Per Page
- Sort Options
Publication Characterization of atomic-beam deposited GeO1-xNx/HfO2 stacks on Ge
; ; ; Publication HfO2 high-k gate dielectrics on Ge(100) by atomic oxygen beam deposition
; Journal article2005, Applied Physics Letters, (86) 3, p.32908Publication HfO2 high-k gate dielectrics on germanium by molecular beam deposition
Oral presentation2004, Semiconductor Interface Specialists ConferencePublication MBE lanthanum-based high-k gate dielectrics as candidates for SiO2 gate oxide replacement
Publication Short minority carrier response time in HfO2/Ge metal-insulator-semiconductor capacitors
Journal article2005, Microelectronic Engineering, 80, p.34-37